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三元名家论坛:Electrical capacitance tomography and industrial applications
作者:     日期:2023-12-01     来源:     阅读:

讲座主题:Electrical capacitance tomography and industrial applications

专家姓名:Wuqiang Yang

工作单位:University of Manchester

讲座时间:2023年12月11日 10:00-12:00

讲座地点:八角湾校区化学化工学院A416

主办单位:烟台大学化学化工学院

内容摘要:

Among various industrial tomography modalities, electrical capacitance tomography (ECT) is the most mature and has been used for many challenging applications. ECT is based on measuring very small capacitance from a multi-electrode sensor and reconstructing the permittivity distribution in a cross section of an industrial process. Compared with other tomography modalities, ECT has several advantages: no radioactive, fast response, both non-intrusive and non-invasive, withstanding high temperature and high pressure and of low-cost. Because of very small capacitance to be measured (much smaller than 1 pF) and the “soft-field” nature, ECT does present challenges in capacitance measurement and solving the inverse problem. The latest AC-based ECT system can generate online images typically at 100 frames per second with a signal-to-noise ratio (SNR) of 73 dB. During this seminar, ECT principle will be discussed, and the AC-ECT system will be introduced. Examples of industrial applications, include gas/oil/water flow measurement, imaging fluidised beds for pharmaceutical manufacturing, clean coal combustion and methanal-to-olefin conversion, will be discussed. Future developments will also be highlighted.

主讲人介绍:

Wuqiang Yang (FIEEE, FIET, FInstMC) graduated from Tsinghua University. Since 1991, he has been working with UMIST and The University of Manchester in the UK. He became Professor of Electronic Instrumentation in 2005. His main research area is ECT and its industrial applications. His technical achievements and social impact are indicated by the fact that many companies and universities use his ECT instrument, to deal with challenging problems, such as multiphase flow measurement. He has published >400 papers and two books with an h-index of 58. He is an Associate Editor of IEEE Open J. IM, and IET Sci. Meas. Technol., and editorial board member of Meas. Sci. Technol., and visiting professor at several universities. He received several national awards, including 2021 IEEE IMS Best Application Award. He was an IEEE Distinguished Lecturer from 2010 to 2016, and one of key organizers of IEEE IST Conference for many years. His biography has been included in Who’s Who in the World since 2002.